Cantilever Probe Cards
We engineer and produce cantilever probe cards for diverse semiconductor testing needs. Assembled locally with epoxy and blade methods, each card adheres to your precise needs, spanning from standard designs to fully customized builds.
Our design workflow is enhanced by proprietary software, guaranteeing high-grade results from start to finish. We integrate client files in formats such as .stl, .stp, .dwg, .dxf, and .grb.
Every delivered card is supported by our agile maintenance and restoration unit.
Advanced Solutions
Epoxy and blade cards, low leakage solutions, high voltage and high current models (offering up to 10kV and 200A), extreme thermal units (–271°C to +300°C), plus dual-sided and bespoke setups.
Testing targets include power semiconductors, MOSFETs, IGBTs, LED arrays, MEMS, flip chips, ceramic bases, optical components, memory slots, logic gates and RF tech.
Technical specifications
- Thermal limits: –271°C (2 Kelvin) to +300°C
- Voltage up to 10kV, current exceeding 200A. Custom assemblies beyond 1000A Pulsed
- Low leakage optimized for the femtoamp (fA) scale
- Probe materials: Tungsten, Rhenium-Tungsten, Beryllium-Copper, Palladium alloy
- Superior precision alignment and surface planarity
- Maintained contact resistance and durable tip life
Single Probe Assembly S.P.A.
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Modular design to suit industry standard 0.4/0.8 inch mounting-hole pitch manipulators
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Voltage up to 10kV, current exceeding 200A
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Low leakage optimized for the femtoamp (fA) scale.
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Probe materials: Tungsten, Rhenium-Tungsten, Beryllium-Copper, Palladium alloy
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Compatible with SP1 Manipulator
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Available with various connector types such as 15-Way D, 26-Way HD, 37/51-Way Micro D and many custom connector interfaces
Off the shelf
48, 70 & 128 Edge connect probe cards
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Thermal limits: –40°C to 200+°C
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Compatible with industry standard 4.5 inch probe card holders (PCH)
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Compatible with industry standard 48, 70 and 128-Way edge connectors
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Probe materials: Tungsten, Rhenium-Tungsten, Beryllium-Copper, Palladium alloy
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Superior precision alignment and surface planarity
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Maintained contact resistance and durable tip life
Bladed Probes
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Thermal limits: –271°C (2 Kelvin) to +300°C
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Voltage up to 10kV, current exceeding 200A
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Low leakage optimised for the femtoamp (fA) scale
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Tip materials: tungsten, tungsten rhenium, copper, palladium
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Superior precision alignment and surface planarity
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Maintained contact resistance and durable tip life
Bespoke probing applications
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Thermal limits: –271°C (2 Kelvin) to +300°C
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Voltage up to 10kV, current exceeding 200A
-
Low leakage optimized for the femtoamp (fA) scale
-
Tip materials: tungsten, tungsten rhenium, copper, palladium
-
Superior precision alignment and surface planarity
-
Maintained contact resistance and durable tip life
